So you have power circuit breakers at your facility, and they seem to be just fine, sitting there quietly doing their job. What you may not realize is that even though your circuit breakers are ...

Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...

In-circuit test (ICT) has been instrumental in identifying manufacturing process defects and component defects on countless varieties of populated printed circuit board (PCB) assemblies for more than ...

A version of Part 1 appeared in the Dec. 2011/Jan. 2012 issue of Test & Measurement World. See the PDF. In January 1979, Electronic Test published an article claiming that a single test circuit that ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

We have all had difficulty testing diodes in-circuit. Most DMM’s have a diode Vf function that measures forward drop, but what is the normal voltage drop? Analog VOM’s attempt to measure resistance of ...

IEEE today announced IEEE 1149.1-2013 “Standard for Test Access Port and Boundary-Scan Architecture,” which aims to cut costs by means of test reuse from IP to the system level. CJ Clark, Intellitech ...