Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
The MOSCap device exhibits versatile functionality, making it a notable advancement in the field of neuromorphic technology. This breakthrough has the potential to inspire further innovations in the ...
A technical paper titled “A 100-Gb/s PAM4 Optical Transmitter in a 3-D-Integrated SiPh-CMOS Platform Using Segmented MOSCAP Modulators” was published by researchers at CalTech and University of ...
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