The AccuMap-SE® combines a high-speed M-2000® spectroscopic ellipsometer with fast mapping for large panels. The broad spectral range is well suited to thin films in photovoltaic applications.
Product Briefing Outline: J.A. Woollam has integrated its Flying M-2000 Spectroscopic Ellipsometer into a mapping tool for thin-film uniformity measurements over the entire PV panel. The high accuracy ...
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